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US 12,681,109 B2Granted
Inspection apparatus and inspection method
AssigneeTokyo Weld Co., Ltd.
InventorsShunsuke Sasaki, Taiyo Komori, Yoshikazu Sasaoka
Life of this patent
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Abstract
An inspection apparatus includes: a voltage application unit that applies voltage to a capacitor to perform charging; a current measurement unit that continuously measures current of the capacitor during the charging; and an anomaly detection unit that detects an anomaly of the capacitor based on a regression line derived from a logarithm of a measured value of the current in a determination time range during the charging and a logarithm of measurement timing of the current.
Claims6
An inspection apparatus comprising:
- a voltage application unit that applies voltage to a capacitor to perform charging;
- a current measurement unit that continuously measures current of the capacitor during the charging;
- and
- a computer processor that detects an anomaly of the capacitor based on a regression line derived from a logarithm of a measured value of the current in a determination time range during the charging and a logarithm of measurement timing of the current.
1 more element
An inspection method comprising the steps of:
- applying voltage to a capacitor to perform charging;
- measuring current of the capacitor continuously during the charging;
- detecting an anomaly of the capacitor based on a regression line derived from a logarithm of a measured value of the current and a logarithm of measurement timing of the current in a determination time range during the charging;
- and
- separately discharging electronic components determined to have the anomaly and electronic components determined not to have an anomaly to the collection device via discharge paths.
2 more elements
Dependencies are inferred from the claim text.