System and method for active electronically scanned array test and calibration
AssigneeRockwell Collins, Inc.
InventorsConnor McBryde, James West
Life of this patent
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AssigneeRockwell Collins, Inc.
InventorsConnor McBryde, James West
Estimating the term…
A test system is presented for validating and calibrating an active electronically scanned array (AESA) with multiple distinct transceiver elements and associated RF channels. The test system includes a static mount for the AESA, and a test probe fixedly located relative to the static mount. The system also includes a network analyzer connected to the AESA and the test probe, and a test processor connected to the network analyzer. The network analyzer provides RF evaluations of amplitudes and phases/time delays to the test processor, which estimates far field (FF) patterns of the AESA based on these inputs and assessments of free space path losses and propagation delays between the AESA and the test probe. The test processor calculates FF figures of merit (FoMs) for the AESA as a function of frequency, beam scan, and environmentals based on the estimated FF patterns, and validates the AESA based on these FF FoMs.
A test system for validating and calibrating an active electronically scanned array (AESA) having a plurality of distinct transceiver elements with associated RF channels, the test system comprising:
A method of testing an AESA, the method comprising:
Dependencies are inferred from the claim text.