Waveform-analyzing method, waveform-analyzing device and analyzing system
AssigneeShimadzu Corporation
InventorShinji Kanazawa
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AssigneeShimadzu Corporation
InventorShinji Kanazawa
Estimating the term…
Provided is a method for analyzing a signal waveform which is a chromatogram or spectrum, including: a model creation step for creating a trained model for locating a peak portion in an input waveform, by machine learning using a plurality of sets of reference waveforms in each of which the position of the peak portion is known; a region estimation step (S11-S14) for dividing an analysis-target waveform into partial waveforms, for determining whether or not each of the partial waveforms is a peak portion by using the trained model, and for estimating different kinds of regions including a peak region and a non-peak region in the analysis-target waveform, based on the determination result; and a detection step (S15) for detecting an incorrect region estimation result by determining whether or not the sequence of the estimated regions along the horizontal axis of the analysis-target waveform conforms to a predetermined regulation.
A waveform-analyzing method for analyzing a signal waveform which is a chromatogram or a spectrum with intensity on a vertical axis and time, wavelength, or mass to charge ratio on a horizontal axis, comprising:
A waveform-analyzing device configured to analyze a signal waveform which is a chromatogram or a spectrum with intensity on a vertical axis and time, wavelength, or mass to charge ratio on a horizontal axis, comprising:
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