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US 12,680,956 B2Granted
Optical measurement device and optical measurement method
AssigneeUshio Denki Kabushiki Kaisha
InventorsTakuma Yokoyama, Katsuya Watanabe
Life of this patent
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Abstract
An illumination device irradiates a predetermined area with measurement light whose wavelength changes over time. A light reception device includes an optical sensor that detects diffuse transmission light of an object located in the predetermined area. The light reception device is structured such that the optical sensor receives a component of the diffuse transmission light through the object which propagates in a direction deviated from an optical axis of the measurement light.
Claims8
An optical measurement device comprising:
- a conveyance device having a through-opening through which light passes, the conveyance device being structured to hold an object by negative pressure applied via the through-opening and to convey the object so as to pass through a predetermined region;
- an illumination device structured to irradiate a predetermined area with measurement light whose wavelength changes over time;
- and
- a light reception device including an optical sensor structured to detect diffuse transmission light through the object passing through the predetermined area, wherein
- the optical measurement device is structured such that an optical path from the illumination device to the light reception device passes through the through-opening, and only the object is present on the optical path, and
- the light reception device is structured such that the optical sensor receives a component of the diffuse transmission light through the object which propagates in a direction deviated from an optical axis of the measurement light.
3 more elements
Dependencies are inferred from the claim text.