Thin film specimen for tensile test and physical property evaluation method for thin film specimen

A method for evaluating physical properties of a thin film specimen, comprising:

• measuring a tensile strength of a thin film specimen by applying tensile force in directions opposite to each other in a state that a grip portion of the thin film specimen having a speckle pattern is fixed;
• and
• analyzing a strain rate of the speckle pattern while applying tensile force to the thin film specimen,
• wherein, in the thin film specimen on which the speckle pattern is formed, a width (a) of a parallel portion is 10 mm, a width (b) of the grip portion is 40 mm, a gauge length (c) of the thin film specimen is 60 mm, and a total length (d) of the thin film specimen is 300 mm,
• wherein the thin film specimen includes a first shoulder portion and a second shoulder portion where a curvature is formed on an outer surface and an inner surface between a parallel portion and a grip portion, respectively, and
• wherein a radius of curvature of both the first shoulder portion and a radius of curvature of the second shoulder portion is 25 mm.