Optical signal processing device and optical signal measurement method
AssigneeTecat Technologies (Suzhou) Limited
InventorChoon Leong Lou
Life of this patent
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Abstract
The present disclosure provides an optical signal processing device configured to measure wafer-scale micro LEDs, including optical signal testing units and an optical signal sensing device. The optical signal testing units are configured to transmit optical signals generated by micro LEDs. An optical signal testing unit transmits an optical signal generated by a micro LED. The optical signal sensing device is configured to sense the optical signals transmitted by the optical signal testing units during a plurality of time periods, and is configured to generate sensing signals according to the optical signals.
Claims20
An optical signal processing device, for testing optical signals of a micro light-emitting diode array, the micro light-emitting diode array being divided into a plurality of testing blocks each comprising a plurality of micro light-emitting diodes, the optical signal processing device testing the testing blocks one by one, the optical signal processing device comprising:
- a plurality of optical signal testing units for:
- transmitting a plurality of first optical signals, wherein the first optical signals are generated by a plurality of first micro light-emitting diodes of a selected testing block of the plurality of testing blocks during a first time period;
- and
- transmitting a plurality of second optical signals, wherein the second optical signals are generated by a plurality of second micro light-emitting diodes of the selected testing block during a second time period;
- and
- an optical signal sensing device for:
- sensing the first optical signals transmitted from the optical signal testing units during the first time period;
- sensing the second optical signals transmitted from the optical signal testing units during the second time period;
- and
- generating a plurality of sensing signals according to the first optical signals and the second optical signals;
- wherein the first micro light-emitting diodes and the second micro light-emitting diodes correspond in position to the optical signal testing units, respectively, and each of the optical signal testing units transmits an optical signal generated by the corresponding micro light-emitting diode, the micro light-emitting diodes being in a one-to-one relation with the optical signal testing units;
- wherein the first micro light-emitting diodes alternate with the second micro light-emitting diodes;
- and
- wherein a position of the optical signal testing units remains unchanged during the first time period and the second time period.
An optical signal measurement method for an optical signal processing device, the optical signal measurement method being adapted to test optical signals of a micro light-emitting diode array, the micro light-emitting diode array being divided into a plurality of testing blocks each comprising a plurality of micro light-emitting diodes, allowing the optical signal processing device to test the testing blocks one by one, with the optical signal processing device comprising a plurality of optical signal testing units and an optical signal sensing device, the optical signal measurement method comprising the steps of:
- aligning the optical signal testing units with the plurality of micro light-emitting diodes of a selected testing block of the plurality of testing blocks on a wafer, wherein the micro light-emitting diodes comprise a plurality of first micro light-emitting diodes and a plurality of second micro light-emitting diodes;
- transmitting, by the optical signal testing units, a plurality of first optical signals generated by the first micro light-emitting diodes during a first time period, wherein each of the optical signal testing units transmits the first optical signal generated by a corresponding one of the first micro light-emitting diodes;
- sensing, by the optical signal sensing device, the first optical signals transmitted from the optical signal testing units and generating, by the optical signal sensing device, a plurality of first sensing signals according to the first optical signals;
- transmitting, by the optical signal testing units, a plurality of second optical signals generated by the second micro light-emitting diodes during a second time period, wherein each of the optical signal testing units transmits the second optical signal generated by a corresponding one of the second micro light-emitting diodes;
- and
- sensing, by the optical signal sensing device, the second optical signals transmitted from the optical signal testing units and generating a plurality of second sensing signals by the optical signal sensing device according to the second optical signals;
- wherein the first micro light-emitting diodes and the second micro light-emitting diodes correspond in position to the optical signal testing units, respectively, and each of the optical signal testing units transmits an optical signal generated by the corresponding micro light-emitting diode, the micro light-emitting diodes being in a one-to-one relation with the optical signal testing units;
- wherein the first micro light-emitting diodes alternate with the second micro light-emitting diodes;
- and
- wherein a position of the optical signal testing units remains unchanged during the first time period and the second time period.
An optical signal measurement method for an optical signal processing device, the optical signal measurement method being adapted to test optical signals of a micro light-emitting diode array, the micro light-emitting diode array being divided into a plurality of testing blocks each comprising a plurality of micro light-emitting diodes, allowing the optical signal processing device to test the testing blocks one by one, with the optical signal processing device comprising a plurality of optical signal testing units and an optical signal sensing device, the optical signal measurement method comprising the steps of:
- aligning the optical signal testing units with a plurality of first micro light-emitting diodes of a selected testing block of the plurality of testing blocks on a wafer;
- transmitting, by the optical signal testing units, a plurality of first optical signals generated by the first micro light-emitting diodes during a first time period, wherein each of the optical signal testing units transmits the first optical signal generated by a corresponding one of the first micro light-emitting diodes;
- sensing, by the optical signal sensing device, the first optical signals transmitted from the optical signal testing units and generating, by the optical signal sensing device, a plurality of first sensing signals according to the first optical signals;
- aligning the optical signal testing units with a plurality of second micro light-emitting diodes of another testing block on the wafer;
- transmitting, by the optical signal testing units, a plurality of second optical signals generated by the second micro light-emitting diodes during a second time period, wherein each of the optical signal testing units transmits the second optical signal generated by a corresponding one of the second micro light-emitting diodes;
- and
- sensing, by the optical signal sensing device, the second optical signals transmitted from the optical signal testing units and generating a plurality of second sensing signals by the optical signal sensing device according to the second optical signals.
Dependencies are inferred from the claim text.