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US 12,676,589 B2Granted
Composite substrate
AssigneeShin-Etsu Chemical Co., Ltd.
InventorsShoji Akiyama, Shozo Shirai, Masayuki Tanno
Life of this patent
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Abstract
A composite substrate that is obtained by bonding a silicon (Si) wafer having an interstitial oxygen concentration of 2 to 10 ppma to a piezoelectric material substrate as a support substrate, and thinning the piezoelectric material substrate after the bonding.
Claims5
A composite substrate manufactured by bonding method comprising sequentially order steps of:
- preparing a piezoelectric material substrate;
- preparing a silicon (Si) wafer having an interstitial oxygen concentration of 2 to 10 parts per million atomic (ppma) as a support substrate;
- bonding the piezoelectric material substrate and the silicon wafer;
- and
- thinning the piezoelectric material substrate after the bonding to form the composite substrate,
- wherein the preparing further comprises providing an intervening layer on either or both surfaces of the piezoelectric material substrate and the silicon wafer prior to the bonding;
- wherein the composite substrate comprises:
- the support substrate consisting of the silicon (Si) wafer having the interstitial oxygen concentration of 2 to 10 parts per million atomic (ppma);
- and
- the piezoelectric material substrate provided on the support substrate.
7 more elements
Dependencies are inferred from the claim text.