Wordline leakage test management
AssigneeMicron Technology, Inc.
InventorsWai Leong Chin, Francis Chee Khai Chew, Trismardawi Tanadi, Chun Sum Yeung, Lawrence Dumalag, Ekamdeep Singh
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AssigneeMicron Technology, Inc.
InventorsWai Leong Chin, Francis Chee Khai Chew, Trismardawi Tanadi, Chun Sum Yeung, Lawrence Dumalag, Ekamdeep Singh
Estimating the term…
A memory sub-system causing execution of a first wordline leakage test of a first wordline group of a set of wordline groups of a memory block in response to determining a temperature of the memory block is within a threshold temperature range. A first result of the first wordline leakage test is determined. A second wordline leakage test of a second wordline group is caused to be executed and a second result is determined. A determination is made that the first result of the first wordline leakage test of the first wordline group satisfies a first condition. A determination is made that the second result of the second wordline leakage test of the second wordline group satisfies a second condition. In response to satisfaction of the conditions, an action is executed.
A system comprising:
A method comprising:
A non-transitory computer-readable storage medium comprising instructions that, when executed by a processing device, cause the processing device to perform operations comprising:
Dependencies are inferred from the claim text.