Back to results
US 12,674,850 B2Granted
System and method for fast magnetometer calibration using gyroscope
AssigneeSTMicroelectronics S.r.l.
InventorsMahaveer Jain, Mahesh Chowdhary
Life of this patent
Estimating the term…
Abstract
An electronic device includes a magnetometer that outputs magnetometer sensor signals and a gyroscope that outputs gyroscope sensor signals. The electronic device includes a magnetometer calibration module that calibrates the magnetometer utilizing the gyroscope sensor signals. The electronic device generates a first magnetometer calibration parameter based on a Kalman filter process. The electronic device generates a second magnetometer calibration parameter based on a least squares estimation process.
Claims20
A method, comprising:
- generating gyroscope sensor signals with a gyroscope of an electronic device;
- generating magnetometer sensor signals with a magnetometer of the electronic device;
- estimating a first magnetometer calibration parameter by performing a first analysis process with the gyroscope sensor signals and the magnetometer sensor signals;
- estimating a second magnetometer calibration parameter by performing a second analysis process different than the first analysis process with the gyroscope sensor signals and the magnetometer sensor signals;
- validating the first and second magnetometer calibration parameters by analyzing a convergence between the first magnetometer calibration parameter and the second magnetometer calibration parameter;
- and
- simultaneously operating multiple instances of the first analysis process and the second analysis process, wherein the multiple instances of the first analysis process are offset from each other in time, wherein simultaneously operating multiple instances of the first analysis process includes continuously calibrating the magnetometer.
4 more elements
An electronic device, comprising:
- a gyroscope configured to output gyroscope sensor signals;
- a magnetometer configured to output magnetometer sensor signals;
- and
- a magnetometer calibration module configured to receive the gyroscope sensor signals and the magnetometer sensor signals and to generate a first magnetometer calibration parameter with a first analysis process with the gyroscope sensor signals and the magnetometer sensor signals and to generate a second magnetometer calibration parameter based on a second analysis process different than the first analysis process with the gyroscope sensor signals and the magnetometer sensor signals, wherein the magnetometer calibration module is configured to simultaneously operate multiple instances of the first analysis process and the second analysis process to continuously calibrate the magnetometer, wherein the multiple instances of the first analysis process and the second analysis process are offset from each other in time.
1 more element
A method, comprising:
- generating a first magnetometer calibration parameter by performing a first analysis process on gyroscope sensor signals and magnetometer sensor signals;
- generating a second magnetometer calibration parameter by performing a second analysis process different than the first analysis process with the gyroscope sensor signals and the magnetometer sensor signals;
- validating the first and second magnetometer calibration parameters by comparing the first and second magnetometer calibration parameters;
- determining an orientation of the electronic device based on the magnetometer sensor signals and at least one of the first and second magnetometer calibration parameters;
- and
- continuously calibrate the magnetometer sensor by simultaneously operating multiple instances of the first analysis process and the second analysis process, wherein the multiple instances of the first analysis process and the second analysis process are offset from each other in time.
3 more elements
Dependencies are inferred from the claim text.