Method and device for a photogrammetric measurement
AssigneeCarl Zeiss GOM Metrology GmbH
InventorsTim Winter, Eric Oertel
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AssigneeCarl Zeiss GOM Metrology GmbH
InventorsTim Winter, Eric Oertel
Estimating the term…
A method and a device for a photogrammetric measurement of measurement features are provided. The device has a multi-camera with at least two individual cameras. A field of vision of at least two of the individual cameras partly overlaps. The method includes capturing images of the measurement features with at least two individual cameras of the multi-camera at different measurement positions, analyzing the captured images of one measurement position and determining 3D identification features of measurement features in the three-dimensional space, the measurement features being located in the overlap region of the individual cameras, using the plurality of captured images for the overlap region and the respective location of each measurement feature in the captured images, identifying the measurement features in the captured images captured from different measurement positions with matching 3D identification features, and calculating the 3D coordinates of the identified measurement features using the plurality of captured images.
A method for photogrammetrically measuring measurement features with a device having a multi-camera, the multi-camera having at least two individual cameras securely connected to one another, with a field of view of at least two of the individual cameras at least partially overlapping, the method comprising:
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