Inspection device and inspection method
AssigneeToyo Seikan Co., Ltd.
InventorTatsuya Shirasaka
Life of this patent
Estimating the term…
Abstract
There is provided an inspection device configured to inspect a printed state of an inspected object surface which is a printed metallic base. The inspection device includes: a processor; and a memory connected to the processor to be able to communicate with the processor, the processor being configured to: acquire inspection image data obtained by imaging the inspected object surface; measure an L* value for each of colors in an L*a*b* colorimetric system of the inspection image data; and inspect the printed state of the inspected object surface based on the L* value.
Claims8
An inspection device configured to inspect a printed state of an inspected object surface which is a printed metallic base, the inspection device comprising:
- a processor;
- and
- a memory connected to the processor to be able to communicate with the processor,
- the processor being configured to:
- acquire inspection image data obtained by imaging the inspected object surface;
- measure an L* value for each of colors in an L*a*b* colorimetric system of the inspection image data;
- and
- inspect the printed state of the inspected object surface based on a difference value ΔL* between the L* value of the Lab* colorimetric system of standard image data as an inspection standard and the L* value of the Lab* colorimetric system of the inspection image data.
An inspection method for inspecting a printed state of an inspected object surface which is a printed metallic base, the inspection method comprising:
- acquiring inspection image data obtained by imaging the inspected object surface;
- measuring an L* value for each of colors in an L*a*b* colorimetric system of the inspection image data;
- and
- inspecting the printed state of the inspected object surface based on a difference value ΔL* between the L* value of the Lab* colorimetric system of standard image data as an inspection standard and the L* value of the Lab* colorimetric system of the inspection image data.
Dependencies are inferred from the claim text.