Device security with physically unclonable functions

An electronic device, comprising:

• a physically unclonable function (PUF) source having a plurality of fuses, the PUF source responsive to an input to provide PUF data based on a measurement of an electrical parameters resulting from a first signal being transmitted through the plurality of fuses;
• and
• processing circuitry in communication with the PUF source, the processing circuitry configured to process the PUF data from the PUF source to perform an operation within the electronic device, the processing circuitry configured to detect a triggering event at the electronic device and determine an event type based on the detected triggering event, the processing circuitry configured to select at least one fuse of the plurality of fuses based on the determined event type, wherein the selected at least one fuse includes a dielectric layer, the processing circuitry configured to change an electrical property of the selected at least one fuse such that the PUF data from the PUF source is modified by lowering a resistance of the selected at least one fuse in response to transmission of a second signal to the selected at least one fuse, and wherein a voltage of the second signal exceeds a breakdown voltage of the dielectric layer.