X-ray inspection apparatus
AssigneeIshida Co., Ltd.
InventorsShinya Ikeda, Kazuyuki Sugimoto, Shinya Yamamoto
Life of this patent
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Abstract
An X-ray inspection apparatus includes a transport unit that transports an article; an irradiation unit that irradiates the article, which is transported by the transport unit, with X-rays; a sensor unit that detects the X-rays; and a control unit that generates an inspection image including the article from a detection result of the X-rays by the sensor unit, and that inspects whether the article includes an abnormality, based on the inspection image. The control unit generates a pseudo-defect image including a virtual abnormality by changing pixel values of some pixels constituting the inspection image generated when the article is inspected, and checks validity of the inspection based on the pseudo-defect image.
Claims7
An X-ray inspection apparatus comprising:
- a conveying unit configured to convey an article;
- an irradiation unit configured to irradiate the article conveyed by the conveying unit with X-rays;
- a sensor unit configured to detect the X-rays;
- and
- a control unit configured to generate an inspection image including the article from a detection result of the X-rays in the sensor unit, and configured to inspect whether the article includes an abnormality based on the inspection image,
- wherein the control unit generates a pseudo-defect image including a virtual abnormality by changing pixel values of some pixels constituting the inspection image generated when the article is inspected and checks validity of an inspection based on the pseudo-defect image,
- the control unit extracts an outline of the article included in the inspection image and generates the pseudo-defect image by changing the pixel values of some of the pixels inside the extracted outline.
Dependencies are inferred from the claim text.