High-frequency semiconductor package
AssigneeMitsubishi Electric Corporation
InventorsTetsunari Saito, Seiichi Tsuji, Hiroaki Minamide, Ko Kanaya, Shunichi Abe
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AssigneeMitsubishi Electric Corporation
InventorsTetsunari Saito, Seiichi Tsuji, Hiroaki Minamide, Ko Kanaya, Shunichi Abe
Estimating the term…
An input feedthrough (8) and an output feedthrough (9) provided on the substrate (3) are wire-connected to an input pad (5) and an output pad (6) of the semiconductor chip (4) respectively. A metal seal ring (12) is provided on the substrate (3) is electrically connected to the metal plate (1) by a through-hole (15). A conductive cap (14) is bonded to the metal seal ring (12) and covers a place above the semiconductor chip (4). Both ends of an isolation metal wire (13) are electrically connected to the metal plate (1) and a loop comes into contact with a lower surface of the conductive cap (14). The isolation metal wire (13) constitutes an isolation wall partitioning an inner space into a region including the input feedthrough (8) and a region including the output feedthrough (9).
A high-frequency semiconductor package comprising:
A high-frequency semiconductor package comprising:
A high-frequency semiconductor package comprising:
A high-frequency semiconductor package comprising:
Dependencies are inferred from the claim text.