Back to results
US 12,666,887 B2Granted
Methods for depositing gap-filling fluids and related systems and devices
AssigneeASM IP Holding B.V.
InventorTimothee Blanquart
Life of this patent
Estimating the term…
Abstract
Methods and systems for manufacturing a structure comprising a substrate. The substrate comprises plurality of recesses. The recesses are at least partially filled with a gap filling fluid. The gap filling fluid comprises a Si—H bond.
Claims17
A method of filling a gap comprising:
- introducing a substrate in a reaction chamber, the substrate being provided with a gap;
- depositing a gap filling fluid on the substrate with a plurality of super cycles, a super cycle consisting of a deposition process cycle, a curing cycle, and a purge between the deposition process cycle and the curing cycle, wherein the deposition process cycle comprises:
- introducing a silicon precursor into the reaction chamber, the silicon precursor comprising silicon and a halogen,
- generating a direct plasma in the reaction chamber, and
- introducing a reactant into the reaction chamber, wherein the reactant consists of one or more of He, Ne, Ar, and Kr;
- wherein the curing cycle comprises, after depositing a gap filling fluid, curing the gap filling fluid, wherein curing the gap filled fluid comprises generating a plasma from a gas consisting of Ar,
- whereby the silicon precursor and the reactant react in the presence of the plasma to form a gap filling fluid that at least partially fills the gap, wherein the gap filling fluid consists of silicon, the halogen, and hydrogen,
- wherein the step of introducing the silicon precursor and the step of generating the plasma are separated by an intra-cycle purge, and
- wherein the step of curing the gap filling fluid comprises generating a direct micro pulsed plasma with a flow rate of at least 10.0 slm of the gas consisting of Ar thereby minimizing redeposition of volatile by-products released during the formation of the gap filling fluid, wherein a RF on time of a pulse of the micro pulsed plasma lasts from at least 1 ps to at most 250 ms and a RF off time of the pulse of the micro pulsed plasma lasts from at least 1.0 μs to at most 500 ms.
6 more elements
A method of filling a gap comprising:
- introducing a substrate in a reaction chamber, the substrate being provided with a gap;
- depositing a gap filling fluid by executing a cyclical deposition process comprising a plurality of super cycles, wherein a super cycle comprises a deposition cycle and a curing cycle,
- wherein the deposition cycle comprises a precursor pulse and a plasma pulse,
- wherein a curing cycle comprises curing the gap filling fluid, wherein curing the gap filled fluid comprises generating a plasma from a gas consisting of He,
- wherein the precursor pulse comprises introducing a silicon precursor into the reaction chamber, the silicon precursor comprising silicon and a halogen,
- wherein the plasma pulse comprises generating a plasma in the reaction chamber and introducing a reactant into the reaction chamber, wherein the reactant comprises a noble gas,
- whereby the silicon precursor and the reactant react in the presence of the plasma to form a gap filling fluid that at least partially fills the gap, the gap filling fluid comprising silicon and hydrogen;
- and
- wherein the precursor pulse and the plasma pulse are separated by an intra-cycle purge, and
- wherein the step of curing the gap filling fluid comprises generating a direct micro pulsed plasma with a flow rate of at least 10.0 slm of the gas consisting of He, thereby minimizing redeposition of volatile by-products released during the formation of the gap filling fluid, wherein a RF on time of a pulse of the micro pulsed plasma lasts from at least 1 ps to at most 250 ms and a RF off time of the pulse of the micro pulsed plasma lasts from at least 1.0 μs to at most 500 ms, and wherein an RF power during generating a direct micro pulsed plasma is 200 W.
7 more elements
Dependencies are inferred from the claim text.