Test signal circuit for testing a radio frequency receiver circuit, a semiconductor chip and a system comprising the test signal circuit

A semiconductor chip comprising:

• a test signal circuit comprising:
• a test signal generator configured to generate a baseband test signal;
• a modulator configured to modulate a local oscillator signal with the baseband test signal to generate a test signal;
• a first transmission element coupled between the modulator and an input of an impedance transforming element;
• a second transmission element coupled to an output of the impedance transforming element,
• wherein the impedance transforming element is configured to lower a first impedance level of the first transmission element to a second impedance level of a second transmission element;
• and
• at least one voltage level detector coupled to the first transmission element, the at least one voltage level detector being configured to detect a voltage level of the test signal;
• and
• a radio frequency receiver circuit.

A system comprising:

• a test signal circuit comprising:
• a test signal generator configured to generate a baseband test signal;
• a modulator configured to modulate a local oscillator signal with the baseband test signal to generate a test signal;
• a first transmission element coupled between the modulator and an input of an impedance transforming element;
• a second transmission element coupled to an output of the impedance transforming element,
• wherein the impedance transforming element is configured to lower a first impedance level of the first transmission element to a second impedance level of a second transmission element;
• and
• at least one voltage level detector coupled to the first transmission element, the at least one voltage level detector being configured to detect a voltage level of the test signal;
• and
• a control circuit, wherein the control circuit comprises:
• a first interface being coupled to a radio frequency receiver circuit for receiving a signal indicative of the test signal being processed by the radio frequency receiver circuit;
• a processor being configured to generate a control signal;
• and
• a second interface being coupled to the test signal generator for transmitting the control signal to the test signal generator.