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OwnerLuc Bourhis, Jörg Kärcher +1inventors
InventorsLuc Bourhis, Jörg Kärcher, Michael Ruf
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A diffraction system for determining a crystalline structure of a sample collects a series of diffraction frames from a crystal sample illuminated by a beam of photonic or particulate radiation, such as X-rays. A plurality of software modules for processing the detected diffraction frames perform different tasks in refining the collected diffraction data, such as harvesting, indexing, scaling, integration, and structure determination. Output parameters from certain modules are used as input parameters in others, and are exchanged between the modules as they become available. The modules operate simultaneously, and generate successive versions of output parameters as corresponding input parameters are changed until a final result is achieved. This provides a system of structure determination that is fast and efficient.
A diffraction system for determining a crystalline structure of a sample under test, the sample being illuminated by an incident beam of radiation and radiation diffracted from the sample being detected by a detector, the system comprising:
A method of controlling a diffraction system for determining a crystalline structure of a sample under test, the sample being illuminated by an incident beam of radiation and radiation diffracted from the sample being detected by a detector, the method comprising:
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