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US 12,660,733 B2Granted
High and low frequency soil and plant analysis systems with integrated measurements
AssigneePrecision Planting LLC
InventorDale M. Koch
Life of this patent
Estimating the term…
Abstract
A soil or plant analysis apparatus to perform low and high frequency measurements is described herein. In one embodiment, the soil analysis apparatus comprises a first sub-system to perform low frequency soil measurements and a second sub-system to perform high frequency soil measurements. The high frequency measurements of the second sub-system are at least 1.25 times the low frequency measurements of the first sub-system.
Claims15
A soil or plant analysis apparatus comprising:
- a first sub-system to perform soil or plant measurements at a first measurement accuracy at a first measurement frequency represented by a first number of measurements per unit area;
- and
- a second sub-system to perform soil or plant measurements at a second measurement accuracy at a second measurement frequency represented by a second number of measurements per unit area, wherein the second measurement frequency of the second sub-system is at least 1.25 times the first measurement frequency of the first sub-system, wherein the first measurement accuracy of the first sub-system is utilized to correct a lower measurement accuracy of the second measurement accuracy of the second sub-system.
Dependencies are inferred from the claim text.