Semiconductor device and method of manufacturing the same
AssigneeAOI Electronics Co., Ltd.
InventorsKatsuhiro Takao, Atsushi Kuroha, Yoshiaki Aizawa
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AssigneeAOI Electronics Co., Ltd.
InventorsKatsuhiro Takao, Atsushi Kuroha, Yoshiaki Aizawa
Estimating the term…
Performance of a semiconductor device is improved. A semiconductor device 1 includes a die pad 2a made of a conductive material, a semiconductor chip CHI provided on an upper surface of the die pad 2a, and a semiconductor chip CH3. The semiconductor chip CHI has a gate pad electrode GP1 and a drain pad electrode DP1, and the semiconductor chip CH3 has a pad electrode AP1. A conductive layer 3 is provided on each upper surface of the gate pad electrode GP1 and the pad electrode AP1 so as to be electrically connected to the gate pad electrode GP1 and the pad electrode AP1. The die pad 2a, the semiconductor chip CH1, the semiconductor chip CH3, and the conductive layer 3 are sealed with a resin layer 5 such that an upper surface of the conductive layer 3 and a lower surface of die pad 2a are exposed. A passive element member 7 including one or more passive elements is provided on upper surfaces of the two conductive layers 3.
A semiconductor device comprising:
A method of manufacturing a semiconductor device comprising steps of:
Dependencies are inferred from the claim text.