Machine-readable code in integrated circuit

Abstract

An integrated circuit (IC) includes a plurality of metal layers, and a machine-readable code in a selected metal layer of the plurality of metal layers. A wafer includes a plurality of the ICs. An IC wafer testing system includes a scanner configured to read the machine-readable code in the metal layer of the IC in the wafer, and a tester configured to perform testing on the IC in the wafer based on testing information obtained from storage based on the machine-readable code. A method may include forming the IC including a plurality of metal layers and forming a selected metal layer of the IC including the machine-readable code in metal in the selected metal layer. The method may further include testing the IC. The machine-readable code reduces the complexity and time needed to setup and test an IC in a wafer.

Dependencies are inferred from the claim text.