Measurement system for measuring an intercept point value of a device-under-test

A measurement system for measuring an intercept point (IPx) value of a device-under-test (DUT) the measurement system comprising:

• an input port which is arranged for being directly or indirectly connected to the DUT;
• and
• a measurement unit which is connected to the input port;
• wherein the input port is configured to receive a first continuous wave (CW) signal and/or a second continuous wave (CW) signal from the DUT, and to receive at least one intermodulation signal of the first and the second CW signal from the DUT, and to forward the received signals to the measurement unit;
• wherein the measurement unit is configured to perform an IPx measurement, the IPx measurement comprising:
• measuring a signal level of at least one or both of the first and the second CW signal, and
• measuring a signal level of the at least one intermodulation signal;
• wherein the measurement unit is operable in a first operating mode and/or in a second operating mode;
• wherein, in the first operating mode, the measurement unit is configured to calculate the IPx value of the DUT based on the results of the IPx measurement and on stored IPx information of the measurement system;
• and
• wherein, in the second operating mode, the measurement unit is configured to conduct a plurality of IPx measurements, wherein a characteristic of the measurement system is changed during at least one of the IPx measurements, and wherein the measurement unit is configured to calculate the IPx value of the DUT based on the plurality of IPx measurements.