Device for adjusting position of chamber and plasma process chamber including the same for semiconductor manufacturing
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsMing Che Chen, Wei-Chen Liao
Life of this patent
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Abstract
A device for a plasma processing chamber includes a base, an upper portion attached to the base and extending transverse to the base, and one or more first through holes defined in the base. The one or more first through holes correspond to one or more openings defined in the plasma processing chamber for attaching the device. The device further includes a second through hole defined in the upper portion, and a gauge located in the second through hole, the gauge configured for recording a position of the plasma processing chamber and a shift in the position of the plasma processing chamber.
Claims20
A device for a plasma processing chamber, comprising:
- a base;
- an upper portion attached to the base and extending transverse to the base;
- one or more first through holes defined in the base, the one or more first through holes corresponding to one or more openings defined in the plasma processing chamber for attaching the device;
- a second through hole defined in the upper portion;
- and
- a gauge located in the second through hole, the gauge configured for recording a position of the plasma processing chamber and a shift in the position of the plasma processing chamber.
A semiconductor substrate processing apparatus, comprising:
- a chamber;
- a resonator housing positioned on the chamber, the resonator housing having a radio frequency (RF) coil disposed within the resonator housing;
- an RF power source connected to the chamber for applying RF power to the RF coil;
- and
- a plurality of jigs disposed about the resonator housing and attached to the chamber via pre-existing holes in the chamber, the plurality of jigs being configured for recording a position of the resonator housing.
A system for operating a semiconductor substrate processing apparatus, comprising:
- a controller including a processor and a memory;
- an actuator operationally coupled to the controller;
- a plasma processing chamber;
- a resonator housing positioned on the plasma processing chamber, the resonator housing having a radio frequency (RF) coil disposed within the resonator housing;
- an RF power source connected to the plasma processing chamber for applying RF power to the RF coil;
- and
- a plurality of jigs disposed about the resonator housing and attached to the plasma processing chamber via pre-existing holes in the plasma processing chamber, the plurality of jigs being configured for recording a position of the resonator housing, wherein the controller is programmed to
- analyze a wafer map of a surface of a semiconductor substrate in the plasma processing chamber, and
- using the wafer map, determine a position of the resonator housing from an initial position;
- and
- control the actuator to adjust one or more of the plurality of jigs to adjust the position of the resonator housing.
Dependencies are inferred from the claim text.