Feature quantity calculating method, screening method, and compound creating method
AssigneeFUJIFILM Corporation
InventorsKyosuke Tsumura, Hiroshi Yamashita, Jun Nakabayashi
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AssigneeFUJIFILM Corporation
InventorsKyosuke Tsumura, Hiroshi Yamashita, Jun Nakabayashi
Estimating the term…
According to one embodiment of the present invention, provided are a feature quantity calculating method which enables calculation of a feature quantity accurately showing chemical properties of a target structure, a screening method which enables efficient screening of a pharmaceutical candidate compound using a feature quantity, and a compound creating method which enable efficient creation of a three-dimensional structure of a pharmaceutical candidate compound using a feature quantity. In one aspect of the present invention, the feature quantity calculating method is a method including a target structure designating step of designating a target structure formed of a plurality of unit structures having chemical properties, a three-dimensional structure acquiring step of acquiring a three-dimensional structure from the plurality of unit structures for the target structure, and a probe feature quantity calculating step of calculating a feature quantity showing a cross-sectional area of one or more kinds of probes for the target structure, in which the probe is a structure in which a plurality of points having a real electric charge and generating a van der Waals force are disposed to be separated from each other.
A feature quantity calculating method comprising:
A feature quantity calculating method comprising:
A feature quantity calculating method comprising:
Dependencies are inferred from the claim text.