US 12,657,497 B2 · Micromotion and stray field compensation of a trapped ion chain

Abstract

Techniques to address the problem of having micromotion and stray fields affect trapped ions and the operation of QIP systems based on trapped ions are described. For example, one technique or approach may involve collecting scattered photons off the ions using a resonant or near-resonant oscillating electric field (e.g., a laser beam or a microwave source) with some projection in the axis or direction of micromotion that one wishes to reduce. Another technique or approach may include raising and lowering the trapping potentials to see how the ion position changes. The information collected from these techniques may be used to provide appropriate adjustments. Accordingly, the present disclosure describes methods, scripts, or techniques that minimize the effects of micromotion.

Claims13

Dependent claims

A method for nulling micromotion in ions in an ion trap, comprising:

performing a heuristic operation that includes:
determining a point at which the ions are in focus,
lowering, at the point at which the ions are in focus, a confining radio frequency (RF) pseudo-potential, and
determining, at the lowered confining RF pseudo-potential and by scanning a compensation field, a new point at which the ions are in focus that corresponds to a substantial nulling of the micromotion;
and
controlling operation of the ion trap based on the substantially nulled micromotion to perform quantum calculations,
wherein determining the point at which the ions are in focus and determining the new point at which the ions are in focus each includes determining a highest value in measurements in a photon density of the ions based on image data of the ions captured by a camera.

4 more elements

Dependencies are inferred from the claim text.

Micromotion and stray field compensation of a trapped ion chain

Life of this patent

Micromotion and stray field compensation of a trapped ion chain

Life of this patent

Abstract

Claims13