Data processing method, and electronic device and storage medium for determining an influence degree of process information on a sudden defect

A data processing method applied to a data processing system, the data processing system including a data processing apparatus, a display apparatus and a distributed storage apparatus, the method comprising:

• receiving, by the data processing apparatus, a sample screening condition of an input of a user on a condition selection interface;
• acquiring, by the data processing apparatus, a production record of each sample of a plurality of samples corresponding to the sample screening condition, wherein the production record includes process information, a production time corresponding to the process information, and an index value;
• the process information includes at least one of a process parameter or a process step;
• the index value is used to represent a defect degree of the sample with regard to a preset defect type;
• the plurality of samples includes defective samples, and index values of the defective samples are greater than a first threshold value;
• determining, by the data processing apparatus, a high-incidence time period of defects according to index values and production times corresponding to the process information in acquired production records of the plurality of samples, the high-incidence time period of defects being a time period in which a distribution probability of defective samples is greater than a second threshold value;
• and
• determining, by the data processing apparatus, an influence degree of the process information on a sudden defect according to the high-incidence time period of defects and the acquired production records;
• sorting, by the data processing apparatus, influence degrees of pieces of acquired process information on the sudden defect;
• and
• displaying, by the display apparatus, the influence degrees of the pieces of process information on the sudden defect after being sorted on the analysis result display interface, so as to adjust at least one of process parameters or process steps that cause the sudden defect.