Specimen observation apparatus and specimen observation method
AssigneeHitachi High-Tech Corporation
InventorKento Nishiura
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AssigneeHitachi High-Tech Corporation
InventorKento Nishiura
Estimating the term…
The present invention provides a technology whereby relative positioning in the horizontal direction between a specimen observation area in a specimen container and an imaging field of view can be reliably performed, even prior to adjusting the focal position in the vertical direction using an auto-focus system. This specimen observation apparatus: obtains a luminance value for an image at a plurality of locations in the specimen container, prior to performing auto-focus; and uses the number of high-luminance regions and the width of those regions and identifies a central position, in the horizontal direction, in the specimen container or uses the number of low-luminance regions and the width of those regions and identifies the central position, in the horizontal direction, in the specimen container.
A specimen observation apparatus configured for observing a specimen contained in a specimen container, the specimen observation apparatus comprising:
A specimen observation method for observing a specimen by using a specimen observation apparatus configured to observe the specimen contained in a specimen container, in which the specimen observation apparatus includes:
Dependencies are inferred from the claim text.