Processing system, management device, and log acquisition method
AssigneeTokyo Electron Limited
InventorMiyoko Kuroda
Life of this patent
Estimating the term…
Loading patent…
AssigneeTokyo Electron Limited
InventorMiyoko Kuroda
Estimating the term…
The processing system includes multiple testers configured to test a semiconductor device, and a management device connected to be capable of performing information communication with the multiple testers. The multiple testers are arranged in a height direction in two or more levels and each of the multiple testers includes a tester-side storage unit configured to store log information related to a state of the tester. The management device collectively outputs a request command for requesting log information to one or more selected testers determined by selecting all the multiple testers or some of the multiple testers, and acquires the log information from the selected tester that has received the request command. The management device acquires the log information when an authenticating unit determines that tester-side identification information matches management identification information, and disables acquisition of the log information to the management device when the authenticating unit determines that the tester-side identification information does not match the management identification information.
A processing system comprising:
A management device connected to be capable of performing information communication with a plurality of testers, the plurality of testers being configured to test a semiconductor device, the management device comprising:
A log acquisition method of a processing system including a plurality of testers configured to test a semiconductor device, and a management device connected to be capable of performing information communication with the plurality of testers, the plurality of testers being arranged in a height direction in two or more levels, each of the plurality of testers including a tester-side storage unit configured to store log information related to a state of the tester, and the log acquisition method comprising:
Dependencies are inferred from the claim text.