Transformer turns number testing circuit

A transformer turns number testing circuit capable of testing the number of coil turns of a to-be-tested transformer based on a reference transformer,

• the transformer turns number testing circuit being configured to be able to supply AC power to primary-side coils of the reference transformer and the to-be-tested transformer,
• the transformer turns number testing circuit being configured to be able to connect the primary-side coils of the reference transformer and the to-be-tested transformer in phase and in series and connect secondary-side coils of the reference transformer and the to-be-tested transformer in phase and in series,
• the transformer turns number testing circuit comprising:
• a reference-side resistance element included in a reference-side loop circuit formed between both ends of the secondary-side coil of the reference transformer;
• a to-be-tested-side resistance element included in a to-be-tested-side loop circuit formed between both ends of the secondary-side coil of the to-be-tested transformer;
• and
• a voltage detector provided in a common line of the reference-side loop circuit and the to-be-tested-side loop circuit, the common line connecting a midpoint between the secondary-side coils of the reference transformer and the to-be-tested transformer and a midpoint between the reference-side resistance element and the to-be-tested-side resistance element,
• wherein each of the reference transformer and the to-be-tested transformer includes a plurality of secondary-side coils,
• the transformer turns number testing circuit is configured to be able to connect each pair of one secondary-side coil of the reference transformer and one secondary-side coil of the to-be-tested transformer in phase and in series, to be able to form reference-side loop circuits, each between both ends of each of the plurality of secondary-side coil of the reference transformer, and to be able to form to-be-tested-side loop circuits, each between both ends of each of the plurality of secondary-side coil of the to-be-tested transformer,
• the reference-side resistance element is provided in each of the reference-side loop circuits,
• the to-be-tested-side resistance element is provided in each of the to-be-tested-side loop circuits, and
• the voltage detector is provided in each of common lines of the reference-side loop circuits and the to-be-tested-side loop circuits, the common lines each connecting a midpoint between the secondary-side coils of the reference transformer and the to-be-tested transformer connected in phase and in series and a midpoint between the reference-side resistance element provided in the reference-side loop circuit and the to-be-tested-side resistance element provided in the to-be-tested-side loop circuit.