Systems and methods for duty cycle measurement
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsTsung-Hsien Tsai, Ruey-Bin Sheen, Chih-Hsien Chang, Cheng-Hsiang Hsieh
Life of this patent
Estimating the term…
Loading patent…
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsTsung-Hsien Tsai, Ruey-Bin Sheen, Chih-Hsien Chang, Cheng-Hsiang Hsieh
Estimating the term…
Systems, methods, and circuits for determining a duty cycle of a periodic input signal are provided. A delay element is configured to delay the periodic input signal based on a digital control word. A digital circuit is configured to generate a first digital control word used to delay the periodic input signal a first amount of time corresponding to a period of the periodic input signal, generate a second digital control word used to delay the periodic input signal a second amount of time corresponding to a portion of the periodic input signal having a logic-level high value, and generate a third digital control word used to delay the periodic input signal a third amount of time corresponding to a portion of the periodic input signal having a logic-level low value. A controller is configured to determine the duty cycle based on the first, second, and third digital control words.
A method for outputting a duty cycle value of a periodic input signal, the method comprising:
A circuit comprising:
A circuit comprising:
Dependencies are inferred from the claim text.