Shunt for use in busbar-to-module connections
AssigneeTektronix, Inc.
InventorsDaniel G. Knierim, Julie A. Campbell, David M. Ediger
Life of this patent
Estimating the term…
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AssigneeTektronix, Inc.
InventorsDaniel G. Knierim, Julie A. Campbell, David M. Ediger
Estimating the term…
A test and measurement accessory has a shunt configured to be located in a current path between a busbar and an electronic module and structured to minimize length added to the current path, the shunt having an opening extending through the shunt, and a resistive portion, the resistive portion configured to form a portion of the current path, and two or more contacts, at least one of the contacts extending through the opening and electrically insulated from the resistive portion of the shunt. A test and measurement accessory has a shunt, two or more contacts, at least one of the contacts extending through the opening, and a resistive portion comprising a plurality of resistors surrounding an insulative portion. A test and measurement accessory has a shunt including a washer having an opening, a resistive portion, and two or more contacts.
A test and measurement accessory, comprising:
A test and measurement accessory, comprising:
Dependencies are inferred from the claim text.