Automatic determination of spectrum and spectrogram attributes in a test and measurement instrument
AssigneeTektronix, Inc.
InventorsGary J. Waldo, Alan Edward Wolke, Barton T. Hickman
Life of this patent
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Abstract
A test and measurement instrument includes a spectrogram generator for producing a first spectrogram image from an input signal, a display for showing the spectrogram image, and a user interface operating in conjunction with the display, the user interface including one or more user controllable inputs and the user interface configured to detect a user action, where the spectrogram generator is structured to produce a second spectrogram image, different from the first spectrogram image, based on the detected user action by the user interface. Methods of automatically generating spectrograms based on user actions are also described.
Claims18
A test and measurement instrument, comprising:
- a spectrogram generator for producing a first spectrogram image from an input signal, the first spectrogram image illustrating a frequency of the input signal on a first axis versus time of the input signal on a second axis, in which the first spectrogram is generated from one or more spectrum blocks, where each of the one or more spectrum blocks specifies pixel values for a respective row of pixels making up the first spectrogram, in which the one or more spectrum blocks are generated from an acquisition sample, and in which data from the acquisition sample overlaps two adjacent spectrum blocks;
- a display for showing the first spectrogram image;
- a user interface operating in conjunction with the display, the user interface including one or more user controllable inputs and the user interface configured to detect a user action;
- and
- the spectrogram generator structured to produce a modified spectrogram image, different from the first spectrogram image, based on the detected user action by the user interface, and in which the modified spectrogram image has a different degree of overlap between two adjacent spectrum blocks used in generating the modified spectrogram image than a degree of overlap between two adjacent spectrum blocks used in generating the first spectrogram image.
A method in a test and measurement instrument including a display, the method comprising:
- generating a first spectrogram image on the display from an input signal acquired by the test and measurement instrument in a display window having a first window size, the first spectrogram image illustrating a frequency of the input signal on a first axis versus time of the input signal on a second axis;
- accepting input from the user to adjust the first window size to a second window size different than the first window size;
- and
- automatically generating a modified spectrogram image on the display from the input signal acquired by the test and measurement instrument to fill the second window based on the input from the user, in which each row of the first spectrogram image is produced from an individual spectral block, and in which automatically generating the modified spectrogram image comprises modifying the first spectrogram image by changing an amount of data from the input signal that is overlapped between two adjacent spectrum blocks.
Dependencies are inferred from the claim text.