Analysis device, specimen production device, inspection device, operation method for specimen production device, and operation method for inspection device

A specimen production device producing a specimen, the device comprising:

• a control unit controlling the specimen production device;
• a production unit producing the specimen;
• a data processing unit processing data;
• and
• a communication unit communicating with an inspection device performing inspection of the specimen, wherein
• in the specimen production device, the data processing unit calculates a value [number of specimens A] representing the number of specimens of no carry-in to the inspection device, and a value [number of specimens B] representing a sum of the number of specimens of which the inspection can be additionally started in the inspection device and the number of specimens of on-inspection of which the inspection is completed in a prescribed time, and
• the control unit prohibits production of a new specimen when the [number of specimens A] and the [number of specimens B] satisfy a first relationship.

An inspection device performing inspection of a specimen, the device comprising:

• a control unit controlling the inspection device;
• an inspection unit inspecting the specimen;
• and
• a data processing unit processing data, wherein
• in the inspection device, the data processing unit calculates a value [number of specimens A] representing the number of specimens of no carry-in to the inspection device, and a value [number of specimens C] representing a sum of the number of specimens of which the inspection can be additionally started in another inspection device and the number of specimens of on-inspection of which the inspection is completed in another inspection device in a prescribed time, and
• the control unit prohibits inspection stop when the [number of specimens A] and the [number of specimens C] satisfy a second relationship.