Inspection system and method
AssigneeNuctech Company Limited
InventorsBicheng Liu, Weizhen Wang, Chunguang Zong, Shangmin Sun
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Abstract
The present disclosure relates to an inspection system and method. The inspection system includes: a ray source, configured to generate rays having different energies; a detector, configured to detect a signal when a ray emitted by the ray source acts on at least one cross section of an inspected object; and a processor, in communication connection with the ray source, configured to adjust an energy of the ray emitted by the ray source according to information representing a material parameter of at least one cross section of the inspected object. The embodiments of the present disclosure is capable of being applicable to radiation inspection of multiple types of inspected objects.
Claims19
An inspection system, comprising:
- a ray source, configured to generate a plurality of rays having different energies;
- a detector, configured to detect a signal when a ray emitted by the ray source acts on at least one cross section of an inspected object;
- and
- a processor, in communication connection with the ray source and the detector,
- wherein the processor is configured to determine, according to a detection result of the detector an information representing a material parameter of the at least one ross section of the inspected object, and dynamically adjust an energy of the ray emitted by the ray source according to the information representing the material parameter of the at least one cross section of the inspected object.
Dependencies are inferred from the claim text.