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US 12,656,252 B2Granted
Scattering microscopy
AssigneeOxford University Innovation Limited
InventorsPhilipp Kukura, Sanli Faez
Life of this patent
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Abstract
A scattering microscopy arrangement uses a microscope to image an object comprising a surface. A light source emits illuminating light and a light detector detects light elastically scattered from the object. An electric potential is applied to the surface that affects the electrochemical properties of the object while imaging. The electric potential provides a contrast mechanism that improves the imaging and allows for characterisation of the object and/or the surrounding environment.
Claims15
A method of monitoring and controlling the binding rate of a particle, the method comprising the steps of;
- imaging an object having a surface and at least one particle with a scattering microscope including a light source arranged to emit illuminating light and a light detector,
- the microscope further arranged to illuminate the object with the illuminating light and to detect light elastically scattered from the object with the light detector;
- and
- applying an electrical potential to the surface of the object to change the electrochemical state of the surface;
- wherein the change of the electrochemical state permits monitoring and controlling of the rate of binding of the particle to the surface, wherein the object is being selected not to have a plasmon resonance frequency at the wavelengths of the illuminating light and at the applied electrical potential.
2 more elements
Dependencies are inferred from the claim text.