Coating thickness measuring apparatus and method

A coating thickness measuring apparatus, comprising:

• a data obtaining unit configured to obtain thickness data indicating a thickness of a coating material applied to a contact portion of a substrate in contact with a coating roll while the substrate is transported by the coating roll;
• and
• a processor configured to create a virtual memory zone having a plurality of storage areas in which correction data is distributed and stored, the processor being configured to correct the thickness data based on the correction data that is pre-stored in a target storage area selected from the plurality of storage areas to generate corrected thickness data,
• wherein the data obtaining unit is configured to further obtain temperature data representing a temperature of the coating roll,
• wherein the processor is configured to correct the thickness data based on the correction data that is pre-stored in the target storage area and the temperature data, and
• wherein the correction data that is pre-stored includes a data table in which roundness values for each temperature of a section of the plurality of sections in contact with the contact portion of the substrate are recorded according to a position of the section along the outer circumference of the coating roll.

A coating thickness measuring apparatus 3, comprising:

• a data obtaining unit configured to obtain thickness data indicating a thickness of a coating material applied to a contact portion of a substrate in contact with a coating roll while the substrate is transported by the coating roll;
• and
• a processor configured to create a virtual memory zone having a plurality of storage areas in which correction data is distributed and stored, the processor being configured to correct the thickness data based on the correction data that is pre-stored in a target storage area selected from the plurality of storage areas to generate corrected thickness data,
• wherein the data obtaining unit is configured to divide an outer circumference of the coating roll into a plurality of sections and obtain roundness data representing a roundness of each of the plurality of sections, before obtaining the thickness data, and
• wherein the processor is configured to divide and store the roundness data of each of the plurality of sections in the plurality of storage areas.

A coating thickness measuring method, which is performed by a device for measuring a thickness of a coating material applied to a substrate, the method comprising:

• creating a virtual memory zone having a plurality of storage areas in which correction data is distributed and stored;
• obtaining thickness data indicating a thickness of a coating material applied to a contact portion of the substrate in contact with a coating roll while the substrate is transported by the coating roll;
• correcting the thickness data based on the correction data that is pre-stored in a target storage area of the plurality of storage areas to generate corrected thickness data;
• and
• before generating the corrected thickness data, obtaining temperature data representing a temperature of the coating roll,
• wherein the generating of the corrected thickness data includes correcting the thickness data based on the correction data that is pre-stored in the target storage area and the temperature data, and
• wherein the correction data that is pre-stored includes a data table in which roundness values for each temperature of a section of a plurality of sections of an outer circumference of the coating roll in contact with the contact portion of the substrate are recorded according to a position of the section along the outer circumference of the coating roll.