Semiconductor device including two or more semiconductor structures that are stacked one on another and method for fabricating the same
AssigneeSK hynix Inc.
InventorHee Sun Lee
Life of this patent
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Abstract
A semiconductor device includes: a first semiconductor structure including a first bonding dielectric layer that is positioned in an uppermost portion of the first semiconductor structure and that includes a first opening; a second semiconductor structure positioned over the first semiconductor structure and including a second bonding dielectric layer that is positioned in a lowermost portion of the second semiconductor structure and that includes a second opening connected to the first opening; a diffusion barrier layer formed along inner walls of the first and second openings; and a metal-containing layer filling the first and second openings where the diffusion barrier layer is formed.
Claims10
A semiconductor device, comprising:
- a first semiconductor structure including a first bonding dielectric layer that is positioned in an uppermost portion of the first semiconductor structure and that includes a first opening;
- a second semiconductor structure positioned over the first semiconductor structure and including a second bonding dielectric layer that is positioned in a lowermost portion of the second semiconductor structure and that includes a second opening connected to the first opening;
- a diffusion barrier layer formed along inner walls of the first and second openings;
- and
- a metal-containing layer filling the first and second openings where the diffusion barrier layer is formed,
- wherein the first opening extends from the first bonding dielectric layer to penetrate at least a portion of the first semiconductor structure, and
- the second opening extends from the second bonding dielectric layer to penetrate at least a portion of the second semiconductor structure.
A method for fabricating a semiconductor device, comprising:
- providing an initial first semiconductor structure that includes first sacrificial pads positioned in an uppermost portion of the initial first semiconductor structure, a first bonding dielectric layer filling a space between the first sacrificial pads, and a first sacrificial through electrode penetrating at least a portion of the initial first semiconductor structure except for the uppermost portion and connected to the first sacrificial pads;
- forming an initial second semiconductor structure that includes second sacrificial pads positioned in a lowermost portion of the initial second semiconductor structure, a second bonding dielectric layer filling a space between the second sacrificial pads, and a second sacrificial through electrode penetrating a portion of the initial second semiconductor structure except for the lowermost portion and connected to the second sacrificial pads, over the initial first semiconductor structure;
- forming first and second openings by removing the first and second sacrificial pads and the first and second sacrificial through electrodes;
- forming a diffusion barrier layer along inner walls of the first and second openings;
- and
- forming a metal-containing layer filling the first and second openings in which the diffusion barrier layer is formed.
Dependencies are inferred from the claim text.