Calibration for routing resistance induced error
AssigneeTexas Instruments Incorporated
InventorsGautam Salil Nandi, Rajavelu Thinakaran, Hariharan Srinivasan
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Abstract
In some examples, a method of performing measurement of a device under test (DUT) coupled to a connector includes determining a first voltage signal representative of a current of the DUT, the current flowing through the connector. The method also includes determining a second voltage signal representative of a voltage of the DUT, as provided at the connector. The method also includes determining a calibration current according to the first voltage signal. The method also includes modifying measurement of the DUT according to the calibration current.
Claims20
An apparatus, comprising:
- a current sense circuit having an output terminal;
- a voltage amplifier having a negative input terminal coupled to the output terminal of the current sense circuit;
- a tunable transconductance amplifier having an input terminal and an output terminal, the input terminal of the tunable transconductance amplifier coupled to the output terminal of the current sense circuit;
- and
- a voltage sense circuit having a first signal input terminal, a second signal input terminal, a third input terminal, and an output terminal, wherein the third input terminal of the voltage sense circuit is coupled to the output terminal of the tunable transconductance amplifier.
An apparatus, comprising:
- a current sense circuit configured to measure a current of a device under test (DUT) to provide a first signal having a voltage representative of the current of the DUT;
- a voltage amplifier coupled to the current sense circuit and configured to provide a second signal to the DUT based on a third signal and a fourth signal, wherein the second signal is a result of differential amplification between the third signal and the first signal;
- a voltage sense circuit configured to measure a voltage of the DUT at a connector to provide the fourth signal;
- and
- a tunable transconductance amplifier coupled to the current sense circuit and the voltage sense circuit, the tunable transconductance amplifier configured to provide a fifth signal to the voltage sense circuit as a calibration signal, wherein the tunable transconductance amplifier determines the fifth signal according to the first signal and a tuning code.
A method of performing measurement of a device under test (DUT) coupled to a connector, the method comprising:
- measuring, with a first sense circuit coupled to the DUT by the connector, a first voltage signal representative of a current of the DUT, the current flowing through the connector;
- measuring, with a second sense circuit coupled to the DUT by the connector, a second voltage signal representative of a voltage across the DUT, as provided at the connector;
- generating, with a calibration circuit, a calibration current signal according to the first voltage signal;
- and
- modifying, with the second sense circuit or an amplifier circuit coupled to the DUT by the connector, the second voltage signal according to the calibration current signal.
Dependencies are inferred from the claim text.