Probe card device
AssigneeSilicon Future Manufacturing Company Ltd.
InventorsTien-Chia Lee, Heng-Rui Chang, You-Chen Lin, Ming-Chang Liao, Wen-Tsung Sung
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AssigneeSilicon Future Manufacturing Company Ltd.
InventorsTien-Chia Lee, Heng-Rui Chang, You-Chen Lin, Ming-Chang Liao, Wen-Tsung Sung
Estimating the term…
A probe card device comprises a testing circuit board, at least one probe and an image capture module. The testing circuit board has a first surface and a second surface in opposite. The at least one probe is disposed on the first surface of the testing circuit board and electrically connected to the testing circuit board. The at least one probe has a probe head and the probe head has a first height to the first surface. The image capture module is disposed on the first surface of the testing circuit board, and is located adjacent to the probe. The image capture module has a head portion and the head portion has a second height to the first surface. Wherein, the second height is smaller than the first height, and the image capture module is aligned to the probe head to capture a visible light image from the probe head.
A probe card device, comprising:
A probe card device, comprising:
Dependencies are inferred from the claim text.