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US 12,650,336 B2Granted
Display apparatus, inspection apparatus for the display apparatus, and control method of the inspection apparatus
AssigneeSamsung Electronics Co., Ltd.
InventorByeongcheol Hyeon
Life of this patent
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Abstract
An inspection apparatus includes: a memory; an image sensor configured to obtain a luminance image of the display apparatus comprising a plurality of pixels; and a processor configured to recognize a defective pixel based on the obtained luminance image, configured to recognize location information of the recognized defective pixel, and configured to control the memory to store the recognized location information of the defective pixel.
Claims15
A display apparatus comprising:
- a display panel comprising a plurality of sub-pixels;
- a memory storing location information of a defective sub-pixel among the plurality of sub-pixels, and storing normal location information and normal luminance correction information for each of normal sub-pixels among the plurality of sub-pixels;
- and
- a processor configured to limit an electrical signal transmitted to the defective sub-pixel based on the location information of the defective sub-pixel stored in the memory,
- wherein the normal luminance correction information for each of the normal sub-pixels comprises information corresponding to an average value of luminance values of the plurality of sub-pixels and a luminance value for each of the normal sub-pixels.
2 more elements
An inspection apparatus comprising:
- a memory;
- an image sensor configured to obtain a luminance image of a display apparatus, the display apparatus comprising a plurality of sub-pixels;
- and
- a processor configured to recognize a defective sub-pixel among the plurality of sub-pixels, based on the obtained luminance image,
- wherein the processor is further configured to recognize location information of the recognized defective sub-pixel, and is further configured to control the memory to store the recognized location information of the defective sub-pixel,
- wherein the memory is removably connected to at least one of the display apparatus and the processor,
- wherein the location information, stored in the memory and of the defective sub-pixel, comprises information indicating to limit an electric signal, applied to the defective sub-pixel of the display apparatus,
- wherein the memory stores normal location information and normal luminance correction information for each of normal sub-pixels among the plurality of sub-pixels, and
- the normal luminance correction information for each of the normal sub-pixels comprises information corresponding to an average value of luminance values of the plurality of sub-pixels and a luminance value for each of the normal sub-pixels.
6 more elements
A control method of an inspection apparatus, the control method comprising:
- obtaining a luminance image of a display panel comprising a plurality of sub-pixels;
- obtaining luminance values for each of the plurality of sub-pixels based on the obtained luminance image;
- recognizing a luminance value, of the luminance values, as less than or equal to a reference luminance value among the obtained luminance values for each of the plurality of sub-pixels;
- recognizing a sub-pixel of the plurality of sub-pixels, having the recognized luminance value as a defective sub-pixel;
- recognizing location information of the recognized defective sub-pixel;
- storing the recognized location information of the defective sub-pixel in a memory;
- and
- storing normal location information and normal luminance correction information for each of normal sub-pixels among the plurality of sub-pixels, and
- wherein the normal luminance correction information for each of the normal sub-pixels comprises information corresponding to an average value of luminance values of the plurality of sub-pixels and a luminance value for each of the normal sub-pixels.
6 more elements
Dependencies are inferred from the claim text.