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US 12,650,296 B2Granted
Method for measuring width and edge profile of a single board in a stack of multiple boards
AssigneeKnauf Gips KG
InventorLeslie Eversole
Life of this patent
Estimating the term…
Abstract
This disclosure provides systems and methods for continuous wallboard manufacturing, and in particular methods that include measuring a wallboard width and edge profiles in a post-kiln stack of at least two wallboards or more with a laser scanner, preferably a two-dimensional (2D) laser scanner positioned at a distance from a post-kiln conveyor and performing a laser scan of the stack passing by on the post-kiln conveyor.
Claims7
A system for manufacturing a wallboard, the system comprising:
- a wallboard manufacturing line,
- one or more kilns configured for receiving wallboards from the wallboard manufacturing line,
- a post-kiln conveyor configured for receiving from the one or more kilns a stack of two or more wallboards, wherein a first wallboard and a second wallboard are aligned in the stack with a front long surface of the second wallboard covering a front long surface of the first wallboard, and wherein the second wallboard in the stack is a target wallboard, and wherein the post-kiln conveyor being configured for moving the stack with a cross-machine surface of the stack moving along the length of the post-kiln conveyor, and
- one or more 2D laser scanners configured to detect a gap between the first wallboard and the second wallboard positioned at a location which is at a distance from the post-kiln conveyor, the one or more 2D laser scanners having a view from the location of a cross-machine surface of the stack situated at a place along the length of the post-kiln conveyor;
- and
- wherein the one or more 2D laser scanners are in operable arrangement with a processor in operable arrangement with a non-transitory, computer-readable medium that stores a computer program which when executed by the processor, selects the target wallboard from the stack for calculations and computes a width and edge profile of the target wallboard in the stack.
3 more elements
Dependencies are inferred from the claim text.