Device for additive manufacturing of a workpiece

A device for additive manufacturing of a workpiece, the device comprising:

• a production platform configured to support a defined material layer of particulate material;
• a structuring tool configured to selectively solidify particulate material of the defined material layer supported on the production platform in order to produce a defined workpiece layer;
• an inspection sensor configured to inspect a target layer that includes at least one of the defined material layer or the defined workpiece layer;
• an evaluation and control unit including an interface configured to obtain a data set defining the workpiece in a plurality of successive workpiece layers one on top of another;
• and
• a position encoder, wherein:
• the evaluation and control unit is configured to control the structuring tool depending on the data set in order to produce the plurality of successive workpiece layers one on top of another from the particulate material,
• the inspection sensor is movable along a movement direction relative to the production platform,
• the inspection sensor includes a first line scan camera, a second line scan camera, and a line light source,
• the first line scan camera, the second line scan camera, and the line light source each extend transversely with respect to the movement direction,
• the inspection sensor is coupled to the position encoder such that the position encoder generates a position signal representing a respective instantaneous position of the inspection sensor relative to the production platform,
• the evaluation and control unit is configured to generate a spatially resolved image of the target layer using the line light source, the first line scan camera, the second line scan camera, and the position signal,
• the evaluation and control unit is configured to control the structuring tool depending on the spatially resolved image,
• the first line scan camera has a first optical axis running orthogonally with respect to the defined material layer, and
• the second line scan camera has a second optical axis running obliquely with respect to the defined material layer.