Plasma processing method
AssigneeHitachi High-Tech Corporation
InventorsMakoto Satake, Takashi Shiota, Taku Iwase, Yasushi Sonoda, Michikazu Morimoto
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AssigneeHitachi High-Tech Corporation
InventorsMakoto Satake, Takashi Shiota, Taku Iwase, Yasushi Sonoda, Michikazu Morimoto
Estimating the term…
The invention provides a plasma processing method capable of constructing a self-limited process excellent in mass productivity in a cycle etching method in which an adsorption step of forming a reaction layer on a surface of an etching target wafer and a desorption step of removing the formed reaction layer using a rare gas in a metastable state are repeated. The plasma processing method includes: an adsorption step of forming a reaction layer on an etching target film by plasma generated using a reactive gas; and a desorption step of removing the reaction layer using the rare gas in the metastable state generated by the plasma. The adsorption step and the desorption step are repeated, and a pressure of the adsorption step is higher than a pressure of the desorption step.
A plasma processing method, comprising:
A plasma processing method, comprising:
A plasma processing method, comprising:
Dependencies are inferred from the claim text.