Material identification assistance device, method, and program

A material identification assisting method of assisting identification of a material using a material identification assistance device, the method comprising:

• a spectral analysis unit accepts a plurality of pieces of spectral data which was acquired by a measurement device in accordance with a predetermined measurement condition to the material and calculates a spectral feature amount of the spectral data by using a model function;
• a standard deviation acquisition unit estimates a standard deviation between the model function and a value which is actually measured by the measurement device on the basis of the spectral feature amount;
• a feature amount error-identification accuracy degree relationship analysis unit calculates an identification accuracy degree when identifying the material by using spectral feature amount-material identifier correlation information which indicates a correspondence relation between material identifiers concerned per spectral feature amount and generates feature amount error-identification accuracy degree correlation information which indicates a correlative relation between a spectral feature amount error and the identification accuracy degree of the material by using the identification accuracy degree concerned and the standard deviation;
• and
• specifying an identification condition of the material on the basis of the identification accuracy degree and executing material inspection, by a material inspection unit,
• wherein identification of the material is based on at least the feature amount error-identification accuracy degree correlation information.

A non-transitory computer readable storage medium storing a program executable by a computer, the program comprising:

• a spectral analysis unit which accepts a plurality of pieces of spectral data which was acquired by a measurement device in accordance with a predetermined measurement condition to the material and calculates a spectral feature amount of the spectral data by using a model function;
• a standard deviation acquisition unit which estimates a standard deviation between the model function and an actually measured value by the measurement device on the basis of the spectral feature amount;
• and
• a feature amount error-identification accuracy degree relationship analysis unit which calculates an identification accuracy degree when identifying the material by using spectral feature amount-material identifier correlation information which indicates a correspondence relation between material identifiers concerned per spectral feature amount and generates feature amount error-identification accuracy degree correlation information which indicates a correlative relation between a spectral feature amount error and the identification accuracy degree of the material by using the identification accuracy degree concerned and the standard deviation,
• wherein identification of the to the material is based on at least the feature amount error-identification accuracy degree correlation information, and
• wherein a material inspection unit which specifies an identification condition of the material on the basis of the identification accuracy degree and executes material inspection.