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US 12,646,582 B2Granted
Data storage device and method for dynamic bit-error-rate estimation scan (BES)
AssigneeSanDisk Technologies LLC
InventorsMahim Gupta, Jia Li, Sugandha Sharma
Life of this patent
Estimating the term…
Abstract
A sensed read threshold voltage can sometimes vary from a write threshold voltage due to one or more factors, such as data retention issues and program disturb conditions. A bit-error-rate estimation scan (BES) can be used to calibrate and optimize read thresholds in this situation. However, as more wordlines are introduced, BES may not provide suitable calibration. In such situations, the BES can be re-performed on certain pages using an additional offset.
Claims20
A data storage device comprising:
- a memory;
- and
- one or more processors, individually or in combination, configured to:
- perform a first bit-error-rate estimation scan (BES) on a scan range in the memory, wherein the BES is performed using a first offset;
- determine whether a page in the scan range comprises DAC shifts below a criterion;
- and
- in response to determining that the page in the scan range comprises DAC shifts below the criterion, perform a second BES on the page, wherein the second BES is performed using a second offset.
4 more elements
A storage system comprising:
- a memory;
- and
- means for:
- performing a first bit-error-rate estimation scan (BES) on a scan range in the memory, wherein the BES is performed using a first offset;
- identifying a page in the scan range that comprises DAC shifts below a criterion;
- and
- performing a second BES on the page, wherein the second BES is performed using a second offset.
4 more elements
In a data storage device comprising a memory, a method comprising:
- performing a first bit-error-rate estimation scan (BES) on a scan range in the memory, wherein the BES is performed using a first offset;
- determining whether a page in the scan range comprises DAC shifts below a criterion;
- and
- in response to determining that the page in the scan range comprises DAC shifts below the criterion, performing a second BES on the page, wherein the second BES is performed using a second offset.
1 more element
Dependencies are inferred from the claim text.