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US 12,646,186 B2Granted
Image analysis device, method, and program
AssigneeFUJIFILM Corporation
InventorKimito Katsuyama
Life of this patent
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AssigneeFUJIFILM Corporation
InventorKimito Katsuyama
Estimating the term…
An image analysis device includes a processor. An infrared thermal image acquisition unit 100 of the processor acquires a first infrared thermal image and a second infrared thermal image obtained by imaging the object from different imaging positions, respectively. A registration unit 110 of the processor performs registration of the first infrared thermal image and the second infrared thermal image. A first processing unit 120 of the processor executes first processing including at least one of discrimination processing, suppression processing, or enhancement processing of background reflection of infrared light from the periphery of the object on an infrared thermal image obtained by imaging the object based on a difference between a temperature distribution of the first infrared thermal image and a temperature distribution of the second infrared thermal image after the registration.
An image analysis device comprising:
An image analysis method that is executed by a processor, the method comprising:
A non-transitory, computer-readable tangible recording medium which records thereon a program that causes, when read by a computer, the computer to realize:
Dependencies are inferred from the claim text.