Signal monitoring by a memory system
AssigneeMicron Technology, Inc.
InventorsDeping He, Huachen Li
Life of this patent
Estimating the term…
Abstract
Methods, systems, and devices for signal monitoring by a memory system are described. A memory system may receive signaling (e.g., from a host system) and may sample the signal and generate an eye diagram. During a normal mode of operation, the memory system monitor characteristics of the eye diagram to improve signaling. The memory system may determine a voltage level of the signaling based on one or more input parameters and sampling times associated with the signaling. An indication of the voltage level of the signaling may be stored (e.g., to a register of the memory system) and may be periodically transmitted to the host system.
Claims15
An apparatus, comprising:
- a controller associated with a memory device, wherein the controller is configured to cause the apparatus to:
- receive a command, the command comprising an indication to initiate a signal quality test;
- determine, at a first time while operating in an active mode of the apparatus and based on a first input parameter, a voltage level of a signal received by the controller relative to a second input parameter based at least in part on receiving the command, the second input parameter comprising a reference voltage level;
- transition from the active mode to a hibernate mode of the apparatus based at least in part on determining the voltage level of the signal;
- write, while operating in the hibernate mode of the apparatus, a value to a register of the memory device to indicate that the signal quality test is complete based at least in part on determining the voltage level of the signal;
- increment, in response to operating in the hibernate mode, the first input parameter;
- transition from the hibernate mode to the active mode based at least in part on incrementing the first input parameter;
- determine, at a second time based on the incremented first input parameter, the voltage level of the signal received by the controller relative to the second input parameter;
- and
- transmit data to a host system based at least in part on writing the value to the register of the memory device, the data comprising an indication of the voltage level of the signal based on the incremented first input parameter and the second input parameter.
An apparatus, comprising:
- a controller associated with a memory device, wherein the controller is configured to cause the apparatus to:
- receive a command, the command comprising an indication to initiate a signal quality test;
- determine, at a first time while operating in an active mode of the apparatus and based on a first input parameter, a voltage level of a signal received by the controller relative to a second input parameter based at least in part on receiving the command, the second input parameter comprising a reference voltage level;
- write data to the memory device based at least in part on determining the voltage level of the signal, the data comprising an indication of the voltage level of the signal based on the first input parameter and the second input parameter;
- write, while operating in a hibernate mode of the apparatus, a value to a register of the memory device to indicate that the signal quality test is complete based at least in part on determining the voltage level of the signal;
- transmit the data to a host system based at least in part on writing the value to the register of the memory device, wherein transmitting the data to the host system is based at least in part on writing the data to the memory device;
- and
- delete the data from the memory device based at least in part on transmitting the data to the host system.
An apparatus, comprising:
- a controller associated with a memory device, wherein the controller is configured to cause the apparatus to:
- receive a command, the command comprising an indication to initiate a signal quality test;
- determine, at a first time while operating in an active mode of the apparatus and based on a first input parameter, a voltage level of a signal received by the controller relative to a second input parameter based at least in part on receiving the command, the second input parameter comprising a reference voltage level;
- write, while operating in a hibernate mode of the apparatus, a value to a register of the memory device to indicate that the signal quality test is complete based at least in part on determining the voltage level of the signal;
- receive a second command to poll the value of the register based at least in part on writing the value to the register of the memory device;
- transmit an indication of the value of the register to a host system based at least in part on receiving the second command;
- and
- transmit data to the host system based at least in part on writing the value to the register of the memory device, the data comprising an indication of the voltage level of the signal based on the first input parameter and the second input parameter.
An apparatus, comprising:
- a controller associated with a memory device, wherein the controller is configured to cause the apparatus to:
- receive a command, the command comprising an indication to initiate a signal quality test;
- select a first input parameter and a second input parameter based at least in part on receiving the command;
- determine, at a first time while operating in an active mode of the apparatus and based on the first input parameter, a voltage level of a signal received by the controller relative to the second input parameter based at least in part on receiving the command, the second input parameter comprising a reference voltage level;
- write, while operating in a hibernate mode of the apparatus, a value to a register of the memory device to indicate that the signal quality test is complete based at least in part on determining the voltage level of the signal;
- and
- transmit data to a host system based at least in part on writing the value to the register of the memory device, the data comprising an indication of the voltage level of the signal based on the first input parameter and the second input parameter.
A non-transitory computer-readable medium storing code comprising instructions which, when executed by a processor of an electronic device, cause the electronic device to:
- receive a command at a memory system, the command comprising an indication to initiate a signal quality test;
- determine, at a first time while operating in an active mode of the memory system and based on a first input parameter, a voltage level of a signal received by the memory system relative to a second input parameter based at least in part on receiving the command, the second input parameter comprising a reference voltage level;
- transition from the active mode to a hibernate mode of the memory system based at least in part on determining the voltage level of the signal;
- write, while operating in the hibernate mode of the memory system, a value to a register of the memory system to indicate that the signal quality test is complete based at least in part on determining the voltage level of the signal;
- increment, in response to operating in the hibernate mode, the first input parameter;
- transition from the hibernate mode to the active mode based at least in part on incrementing the first input parameter;
- determine, at a second time based on the incremented first input parameter, the voltage level of the signal received by the memory system relative to the second input parameter;
- and
- transmit data to a host system based at least in part on writing the value to the register of the memory system, the data comprising an indication of the voltage level of the signal based on the incremented first input parameter and the second input parameter.
A method, comprising:
- receiving a command at a memory system, the command comprising an indication to initiate a signal quality test;
- determining, at a first time while operating in an active mode of the memory system and based on a first input parameter, a voltage level of a signal received by the memory system relative to a second input parameter based at least in part on receiving the command, the second input parameter comprising a reference voltage level;
- transitioning from the active mode to a hibernate mode of the memory system based at least in part on determining the voltage level of the signal;
- writing, while operating in the hibernate mode of the memory system, a value to a register of the memory system to indicate that the signal quality test is complete based at least in part on determining the voltage level of the signal;
- incrementing, in response to operating in the hibernate mode, the first input parameter;
- transitioning from the hibernate mode to the active mode based at least in part on incrementing the first input parameter;
- determining, at a second time based on the incremented first input parameter, the voltage level of the signal received by the memory system relative to the second input parameter;
- and
- transmitting data to a host system based at least in part on writing the value to the register of the memory system, the data comprising an indication of the voltage level of the signal based on the incremented first input parameter and the second input parameter.
Dependencies are inferred from the claim text.