Electronic apparatus for performing a connection resistance test
AssigneeSamsung Display Co., Ltd.
InventorsKyung-Mok Lee, Dong-Youb Lee
Life of this patent
Estimating the term…
Abstract
An electronic apparatus includes an electronic panel including a first pad part and a second pad part having a portion electrically connected to the first pad part, a driving circuit including a bump part overlapping the first pad part in a plan view, and a circuit board including a lead part overlapping the second pad part in a plan view. The lead part including a plurality of test leads includes a first test lead group electrically connected to the first pad part, and a second test lead group insulated from the first pad part, and one test lead of the first test lead group and one test lead of the second test lead group are electrically connected to each other.
Claims19
An electronic apparatus comprising:
- an electronic panel including a first pad part and a second pad part having a portion electrically connected to the first pad part;
- a driving circuit including a bump part overlapping the first pad part in a plan view;
- and
- a circuit board including a lead part overlapping the second pad part in a plan view, wherein
- the lead part comprising a plurality of test leads includes:
- a first test lead group electrically connected to the first pad part;
- and
- a second test lead group insulated from the first pad part,
- one test lead of the first test lead group and one test lead of the second test lead group are electrically connected to each other,
- the circuit board comprises a plurality of terminals electrically connected to the plurality of test leads,
- the plurality of terminals include a first terminal receiving a ground voltage, and
- the one test lead of the first test lead group and the one test lead of the second test lead group are electrically connected to the first terminal.
An electronic apparatus comprising:
- an electronic panel including a first pad part and a second pad part having a portion electrically connected to the first pad part;
- a driving circuit including a bump part overlapping the first pad part in a plan view;
- and
- a circuit board including a lead part overlapping the second pad part in a plan view, wherein the lead part comprising a plurality of test leads includes:
- a first test lead group electrically connected to the first pad part;
- and
- a second test lead group insulated from the first pad part,
- one test lead of the first test lead group and one test lead of the second test lead group are electrically connected to each other
- the first pad part comprises N first test pads,
- the second pad part comprises N second test pads and N third test pads,
- the bump part comprises N test bumps,
- the first test lead group and the second test lead group each comprises N test leads, and
- N is a natural number greater than or equal to 3.
An electronic apparatus comprising:
- an electronic panel including a first pad part and a second pad part having a portion electrically connected to the first pad part;
- a driving circuit including a bump part overlapping the first pad part in a plan view;
- a circuit board including a lead part overlapping the second pad part in a plan view;
- and
- a plurality of terminals electrically connected to a plurality of test leads,
- wherein the lead part comprises the plurality of test leads and includes:
- a first test lead group and a third test lead group which are electrically connected to the first pad part and spaced apart from each other;
- and
- a second test lead group and a fourth test lead group which are insulated from the first pad part and spaced apart from each other,
- wherein one test lead of the second test lead group and one test lead of the fourth test lead group are electrically connected to each other,
- wherein the plurality of terminals include a first terminal receiving a ground voltage, and
- wherein at least two test leads selected from one test lead of the first test lead group, one test lead of the second test lead group, one test lead of the third test lead group, and at least one test lead of the fourth test lead group are electrically connected to the first terminal.
Dependencies are inferred from the claim text.