Semiconductor device and method of monitoring a temperature thereof

A semiconductor device comprising:

• a temperature-dependent current generator configured to:
• receive a first current, a second current, and a third current which are generated by a temperature-independent current generator and substantially independent of temperature;
• and
• generate a temperature-dependent current dependent of temperature based on the second current and the third current;
• and
• a first counter responsive to the first current and configured to generate a first chop signal, wherein the temperature-dependent current generator is configured to reduce a current mismatch between the second current and the third current responsive to the first chop signal.

A method of monitoring a temperature of a semiconductor device, comprising:

• generating, by a temperature-independent current generator, a reference current substantially independent of temperature, and first, second, and third currents that are substantial duplicates of the reference current;
• and
• generating, by a temperature-dependent current generator, a temperature-dependent current dependent of temperature based on the second and third currents received thereby;
• generating, by a first counter, a chop signal responsive to the first current;
• and
• reducing, by the temperature-dependent current generator, a current mismatch between the second and third currents responsive to the chop signal.