Systems and methods for material accretion detection and removal

A method for monitoring at least one component within a device, the method implemented on a computer system including at least one processor in communication with at least one memory device, the method comprising:

• storing a plurality of baseline information associated with the at least one component to be monitored;
• receiving a plurality of current images of the at least one component to be monitored;
• detecting a deviation from baseline based upon the plurality of current images and the plurality of baseline information;
• receiving contextual sensor information from one or more sensors measuring internal operational parameters of the component to be monitored, wherein the internal operational parameters are separate from the deviation;
• executing a machine-learning trained model to classify the deviation, wherein the machine-learning trained model is trained to classify deviations and identify a material of the deviation based upon the plurality of baseline information, the contextual sensor information received, and a plurality of historical images of the at least one component to be monitored;
• and
• implementing a corrective action based on the classification of deviation.