Manufacturing condition optimization apparatus, computer program product, and manufacturing condition optimization method
AssigneeKonica Minolta, Inc.
InventorsKenichi Kadena, Ryuji Kamata, Isamu Hisamitsu
Life of this patent
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Abstract
A manufacturing condition optimization apparatus includes a yield estimator for estimating a yield of a product having a quality that passes inspection by inspection equipment when a manufacturing condition of the product that is manufactured by manufacturing equipment is changed and an optimization processor for calculating an amount of change in the manufacturing condition at which the yield is maximized.
Claims10
A manufacturing condition optimization apparatus comprising:
- a hardware processor, wherein
- the hardware processor is configured to:
- estimate a yield of a product having a quality that passes an inspection by inspection equipment based on a quality of the product at a predetermined time when a manufacturing condition of the product that is manufactured by manufacturing equipment is changed at the predetermined time;
- calculate an amount of change in the manufacturing condition at the predetermined time such that the yield of the product is maximized;
- and
- adjust the manufacturing condition based on the amount of change in the manufacturing condition at the predetermined time to maximize the yield of the product.
A computer program product including a non-transitory computer readable storage medium having instructions stored thereon that, when executed by one or more hardware processors, cause the one or more hardware processors to performs operations comprising:
- estimating a yield of a product having a quality that passes an inspection by inspection equipment based on a quality of the product at a predetermined time when a manufacturing condition of the product that is manufactured by manufacturing equipment is changed at the predetermined time;
- calculating an amount of change in the manufacturing condition at the predetermined time such that the yield of the product is maximized;
- and
- adjusting the manufacturing condition based on the amount of change in the manufacturing condition at the predetermined time to maximize the yield of the product.
A manufacturing condition optimization method for a manufacturing condition optimization apparatus, the method comprising:
- estimating a yield of a product having a quality that passes an inspection by inspection equipment based on a quality of the product at a predetermined time when a manufacturing condition of the product that is manufactured by manufacturing equipment is changed at the predetermined time;
- calculating an amount of change in the manufacturing condition at the predetermined time such that the yield of the product is maximized;
- and
- adjusting the manufacturing condition based on the amount of change in the manufacturing condition at the predetermined time to maximize the yield of the product.
Dependencies are inferred from the claim text.